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The excellent behavior of thin-film SOI MOSFETs at high temperature makes SOI technology highly suitable for high-temperature IC applications. Indeed, the major causes of failure in bulk CMOS logic at high temperature, specifically, excessive power consumption and degradation of logic levels and noise margin, are observed to be much reduced in SOI circuits. Latchup is, of course, totally suppressed when

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temperatures. Sometimes, one can visually determine the problem area. At this stage, refer to schematics and actual PCB layout artwork to determine if proper creepage and clearance distances were implemented and the component selected was rated for a high transient event and used correctly for its intended application. 9.3.2 Differential Measurement of RF Currents on Cables and Interconnects Immunity problems in electronic equipment caused by conducted EMI noise on cables can be difficult to diagnose, especially if operational problems appear to be intermittent in nature. Sources of noise include EFTs, ESD, and radio transmitters. A simple procedure using a matched set of current probes can be used to troubleshoot immunity problems in equipment.* By determining the path of the resulting noise currents in equipment, one has made progress toward finding the source of the problem. The procedure uses a pair of matched current probes to find which equipment cables are carrying RF current and the direction of the current flow. In Figure 9.12, high-frequency energy from a radiated ESD event is coupled onto the telephone cable (upper right cable). The resulting RF current is monitored by a current probe. The question is, which cable is carrying undesired RF current and in which direction Current arriving on one cable must exit on the other cable or radiate from the equipment itself. A second current probe is placed on the cables one at a time to determine the role of each cable in creating a path for the ESD pulse. Figure 9.13 shows the result of placing a second current probe on the serial cable (the left cable in Figure 9.12).

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where is the SNR at the RX, and H is the normalized transfer function from the TX to the RX (as we are for now dealing with the frequency- at case, the transfer function is just a scalar number). The key statement of this equation is that capacity increases only logarithmically with the SNR, so that boosting the transmit power is a highly ineffective way of increasing capacity. Consider now the MIMO case, where the channel is represented by matrix Eq. (20.28). Let us then consider a singular value decomposition 11 of the channel: H = W U (20.32)

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ro [( gm + gmb ) + j C gs ] + j C gs Rd ( 1 + j Cds ro ) 1 Rs , 1 + j C gs ro + ( Rd + Rs ) ( 1 + j Cds ro ) 1+

The announcement of V.92 certainly is not as dramatic as that of V.90, which nearly doubled downstream transmission rates. It does, however, offer considerable advantages for dial-up users, including not only those without broadband access via ADSL, cable modem networks, or satellite but also those of us who use modem connections on the road or as a backup in the event of a broadband access failure. Essentially, that means that all users stand to bene t at one time or another once V.92 modems are widely available and widely supported by ISPs. Unfortunately, there seems to be no market driver signi cant enough to compel the ISPs to expend the capital necessary to upgrade V.90 servers to V.92. Some V.90 modems can be upgraded to V.92 via a network download [12 14]. 6.2.2 Codecs

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